- 品牌：
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- Texas Instruments (154)
- ON Semiconductor (23)
- NXP Semiconductors (15)
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194 条记录
| 图片 | 型号 | 品牌 | 描述 | 起订量 | 库存 | 操作 |
|---|---|---|---|---|---|---|
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC 11-BIT I-WS BUS ... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC ADDRESSABLE S... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC ADDRESSABLE S... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 | |
|
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC 17BIT UNIV STRG... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN-TEST-DEV/... |
1 | 2,000 | 加入询价 | |
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Texas Instruments | IC SCAN TEST DEVI... |
1 | 2,000 | 加入询价 |
